Specular Reflection Spectroscopy with Viewing
FTIR specular reflection sampling represents an important technique useful for measurement of films on reflective substrates and bulk solid materials. The optical design of commercial specular reflection accessories requires the reflected infrared beam to be collected at an angle that is the same as the angle of incidence. In most cases, the sample is placed face down on a sampling mask or optical body of the accessory making it difficult to determine the exact sampling point. The aim of this application note is to collect an infrared spectrum of various printed colors on a coated aluminum surface using a specular reflection accessory with viewing capabilities for precise sample positioning.
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