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Map300

  • Map300
  • Map300
  • Map300
  • Map300

Description

12 inch (300 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  read more
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Description

The Map300 is a fully automated accessory for the mapping analysis of wafers. Sampling may be performed in specular reflection or transmission mode. This accessory fits inside the sample compartment of most full size FTIR instruments. It can accept wafers up to 12 inches (300 mm) in diameter. Contact PIKE for custom mounts. Precision motion may be programmed in R-theta or Cartesian coordinates using the PIKE AutoPROTM software. The optics of the accessory are purgeable, and fully purgeable enclosure for the sample is optional.

Automated transmission and specular reflection mapping of wafers

Up to 12 inch wafers

Custom wafer mounts available

More Information

More Information

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