Optimization of Grazing Angle ATR for the Analysis of Monolayers on Silicon
Interest in the analysis of monomolecular layers on silicon has grown significantly with the development efforts for molecular electronic devices. The need now exists to probe layers a few nanometers in thickness reliably and reproducibly. Traditional FT-IR sampling techniques such as transmission or ATR typically measure samples or coatings on samples where the thickness is 3 orders of magnitude greater. Grazing angle reflection techniques have been used successfully to measure monomolecular layers on reflective substrates.
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