High-Precision Reflectivity Measurements of Large and Small Diffuse Samples
The External Integrating Sphere accessory measures midinfrared directional hemispherical reflectance. By using the spectrometer’s external beam, the sphere is positioned outside the sample compartment and accommodates samples from extra-large to small in size. The measurement technique uses an internal face of the sphere’s diffuse gold wall for the reference scan (Third Taylor Method). Thus, the only difference between the sample and reference measurement is the first reflection off of the sample. This method is known to be more accurate, since no substitution error is present. By utilizing highly-accurate methodology for the measurement, quality components and sensitive MCT detection, the External Integrating Sphere offers low-noise, precise measurements of a wide range of samples.
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