Wafer Analysis
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Wafer Analysis

Vertical Wafer Accessory
Vertical Wafer Accessory (PN 073-26XX)

Mapping accessory for wafers and samples up to 6 inch diameters. R-Theta or x-y programmable motion controlled. More Info >

MappIR
MappIR (PN 016-28XX)

8 inch (200 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

Map300
Map300 (PN 017-28XX)

12 inch (300 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

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This newest PIKE catalog contains details on a wide range of spectrometer accessories, applications and theory.

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UPCOMING TRADE SHOWS


SPIE Photonics West
Booth 143
January 30–February 1, San Francisco, CA
 
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Booth 2424
February 27–March 1, Orlando, FL
 
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Booth 422
March 18-20, New Orleans, LA
 

Tel: 608.274.2721
info@piketech.com

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