Wafer Analysis
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Wafer Analysis

Vertical Wafer Accessory
Vertical Wafer Accessory (PN 073-26XX)

Mapping accessory for wafers and samples up to 6 inch diameters. R-Theta or X-Y programmable motion controlled. More Info >

MappIR
MappIR (PN 016-28XX)

8 inch (200 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

Map300
Map300 (PN 017-28XX)

12 inch (300 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

DOWNLOAD A CATALOG TODAY!

This newest PIKE catalog contains details on a wide range of spectrometer accessories, applications and theory.

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IR SPECTRA TRAINING COURSE


Presenters:
Ellen Miseo, Jenni Briggs, Gloria Story
 
Problems with FT-IR Spectra 
and How to Avoid Them
PITTCON Course#: SC070

Wednesday: 03/20/2019 
at the PITTCON Conference

 

Register>


Tel: 608.274.2721
info@piketech.com

 

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