Wafer Analysis
Home > Wafer Analysis

Wafer Analysis

Vertical Wafer Accessory
Vertical Wafer Accessory (PN 073-26XX)

Mapping accessory for wafers and samples up to 6 inch diameters. R-Theta or x-y programmable motion controlled. More Info >

MappIR
MappIR (PN 016-28XX)

8 inch (200 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

Map300
Map300 (PN 017-28XX)

12 inch (300 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

DOWNLOAD A CATALOG TODAY!

This newest PIKE catalog contains details on a wide range of spectrometer accessories, applications and theory.

Download>

NEWS

PIKE Reflections Newsletter

Find out what's new at PIKE Technologies!

Read application notes, discover new sampling solutions, and more.

Read Now >

 

 

 

 


UPCOMING TRADE SHOW

Visit us at ICAVS 

June 11 - 16

Booth 13

Victoria, BC  Canada

 

 


Tel: 608.274.2721
info@piketech.com