Wafer Analysis
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Wafer Analysis

Vertical Wafer Accessory
Vertical Wafer Accessory (PN 073-26XX)

Mapping accessory for wafers and samples up to 6 inch diameters. R-Theta or x-y programmable motion controlled. More Info >

MappIR
MappIR (PN 016-28XX)

8 inch (200 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

Map300
Map300 (PN 017-28XX)

12 inch (300 mm) wafer mapping accessory. Specular reflection and transmission sampling in one accessory. Custom inserts available.  More Info >

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PITTCON
Booth 2424
February 27–March 1, Orlando, FL
 
ACS 
Booth 422
March 18-20, New Orleans, LA
 
Analytica
Hall A2, Stand 229
April 10–13, Munich Germany
 
Thank You to all who visited us at SPIE Photonics West!
 
 

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info@piketech.com

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